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KMID : 0385519920050010121
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Analytical Science & Technology
1992 Volume.5 No. 1 p.121 ~ p.126
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Transmission Electron Microscopy of GaAs Planar Defects
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조남희/Cho, N.H.
홍국선/Carter, C. B./Hong, Kug Sun/Cater, C.B.
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Abstract
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Transmission electron microscopy. GaAs Planar defe
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KEYWORD
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